Browsing by Author "Schmid, Detlef"

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    Integrated tools for automatic design for testability
    (1988) Schmid, Detlef; Wunderlich, Hans-Joachim; Feldbusch, Fridtjof; Hellebrand, Sybille; Holzinger, Jürgen; Kunzmann, Arno
    An increasing part of the overall costs of custom and semicustom integrated circuits has to be spent for test purposes, and therefore the integration of test and design seems to be a key of cost reduction. At the University of Karlsruhe a program system is currently developed supporting the design of testable circuits. The program system under work essentially solves three tasks: 1.) Selection of an economical test strategy. 2.) Implementation of necessary circuit modifications in order to enhance testability, retaining the circuit function by construction. 3.) Generation of the test program.
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    The integration of test and high level synthesis in a general design environment
    (1986) Schmid, Detlef; Camposano, Raúl; Kunzmann, Arno; Rosenstiel, Wolfgang; Wunderlich, Hans-Joachim
    This paper describes the integration of new tools for both test and synthesis of integrated circuits. The presented design system CADDY (Carlsruhe Digital Design System) automatically transforms a functional description into a circuit structure. Besides this logic synthesis the system also automatically integrates a complete or incomplete scan path. The software tool PROTEST (PRObabilistic TESTability analysis tool) determines the random testability of the combinational parts of synthesized circuits and suggests optimized input signal probabilities to minimize the necessary test length. To generate these test patterns on chip a specific test hardware is proposed.