1. OPUS

Auflistung nach Autor Tiziani, Hans J.

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ErscheinungsdatumTitelAutor(en)
1991Schnelle 3-D-Kamera mit adaptierbaren, hochauflösenden MarkierungscodesMalz, Reinhard; Tiziani, Hans J.
1990Self-induced photorefractive spatial frequency filterMöbus, Günter; Schmidt, B.; Tiziani, Hans J.
1992A simplified multi-wavelength ESPI contouring technique based on a diode laser systemPeng, Xiang; Zou, Yunlu; Diao, Hongyan; Tiziani, Hans J.
1993A simplified multi-wavelength ESPI contouring technique based on a diode laser system. 2, Automatic fringe analysisPeng, Xiang; Zou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1993Spatial light modulator used for the Fourier transformation of video imagesSchönleber, Martin; Tiziani, Hans J.
1986A spatial light modulator using BSO crystalsHöller, Frank S.; Tiziani, Hans J.
1987Speckleverfahren zur absoluten AbstandsmessungHege, Günter; Tiziani, Hans J.
1970Speckling in diffraction patterns and optical images formed with the laserHopkins, Harold H.; Tiziani, Hans J.
1972A study of the use of laser speckle to measure small tilts of optically rough surfaces accuratelyTiziani, Hans J.
1983Temperature induced deformations in BSO crystals due to photoconductivityLeonhardt, Klaus; Tiziani, Hans J.
1985Testing aspheric surfaces with computer-generated holograms : analysis of adjustment and shape errorsDörband, Bernd; Tiziani, Hans J.
1988Testing of aspheric surfaces with computer generated hologramsTiziani, Hans J.; Packroß, Bernd; Schmidt, Gerhard
1966A theoretical and experimental study of lens centring errors and their influence on optical image qualityHopkins, Harold H.; Tiziani, Hans J.
1994Three-dimensional analysis by a microlens-array confocal arrangementTiziani, Hans J.; Uhde, Hans-Martin
1994Three-dimensional image sensing by chromatic confocal microscopyTiziani, Hans J.; Uhde, Hans-Martin
1990Triangulationssensoren für RoboteranwendungenSeitz, Günther; Jahn, Gerald; Tiziani, Hans J.
1993Two wavelength heterodyne absolute ranging technique using suppressed carrier modulationFischer, Edgar; Dalhoff, Ernst; Ittner, Thomas; Kreuz, Silke; Tiziani, Hans J.
1991Two-wavelength double heterodyne interferometry using a matched grating techniqueSodnik, Zoran; Fischer, Edgar; Ittner, Thomas; Tiziani, Hans J.
1988Untersuchung der Störanfälligkeit von Meßverfahren zur Bestimmung der MTF aus der KantenbildanalyseLei, Fang; Tiziani, Hans J.
1976The use of optical transfer function for assessing the quality of optical systemsTiziani, Hans J.
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