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ErscheinungsdatumTitelAutor(en)
2016Efficient algorithms for fundamental statistical timing analysis problems in delay test applications of VLSI circuitsWagner, Marcus
2018Efficient fault tolerance for selected scientific computing algorithms on heterogeneous and approximate computer architecturesSchöll, Alexander
2012Efficient location-based logic diagnosis of digital circuitsHolst, Stefan
2018Efficient modeling and computation methods for robust AMS system designGil, Leandro
2010Efficient programmable deterministic self-testHakmi, Abdul-Wahid
2012Effiziente mehrwertige Logiksimulation verzögerungsbehafteter Schaltungen auf datenparallelen ArchitekturenSchöll, Alexander
2013Embedding deterministic patterns in partial pseudo-exhaustive testSannikova, Anastasia
2020Error control scheme for malicious and natural faults in cryptographic modulesGay, Mael; Karp, Batya; Keren, Osnat; Polian, Ilia
2011Evaluation of advanced techniques for structural FPGA self-testAbdelfattah, Mohamed
2011Evaluation of backtracing based diagnosis algorithmsBadreldein, Maha
2018Fault emulation for reconfigurable scan networksSchwachhofer, Denis
2015Fault tolerance infrastructure and its reuse for offline testing : synergies of a unified architecture to cope with soft errors and hard faultsImhof, Michael E.
2012Fault tolerant routing algorithm for fully- and partially-defective NoC switchesNajmabadi, Seyyed Mahdi
2012Framework für beschleunigte Monte-Carlo-Molekularsimulationen auf hybriden ArchitekturenHalder, Sebastian
2022High performance 4D light field disparity estimation, super-resolution and compressionTran, Trung Hieu
2011Implementing density functional theory (DFT) methods on many-core GPGPU acceleratorsGosswami, Bishwajit Mohan
2017Improvement of hardware reliability with aging monitorsLiu, Chang
2014In-field structural methods for end-to-end automotive digital diagnosisCook, Alejandro
2014Integration von algorithmenbasierter Fehlertoleranz in grundlegende Operationen der linearen Algebra auf GPGPUsHalder, Sebastian
2020IPM-RED : combining higher-order masking with robust error detectionKeren, Osnat; Polian, Ilia