05 Fakultät Informatik, Elektrotechnik und Informationstechnik
Permanent URI for this collectionhttps://elib.uni-stuttgart.de/handle/11682/6
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Item Open Access Metrics and algorithms for locally fair and accurate classifications using ensembles(2022) Lässig, Nico; Oppold, Sarah; Herschel, MelanieTo obtain accurate predictions of classifiers, model ensembles comprising multiple trained machine learning models are nowadays used. In particular, dynamic model ensembles pick the most accurate model for each query object, by applying the model that performed best on similar data. Dynamic model ensembles may however suffer, similarly to single machine learning models, from bias, which can eventually lead to unfair treatment of certain groups of a general population. To mitigate unfair classification, recent work has thus proposed fair model ensembles , that instead of focusing (solely) on accuracy also optimize global fairness . While such global fairness globally minimizes bias, imbalances may persist in different regions of the data, e.g., caused by some local bias maxima leading to local unfairness . Therefore, we extend our previous work by including a framework that bridges the gap between dynamic model ensembles and fair model ensembles. More precisely, we investigate the problem of devising locally fair and accurate dynamic model ensembles, which ultimately optimize for equal opportunity of similar subjects. We propose a general framework to perform this task and present several algorithms implementing the framework components. In this paper we also present a runtime-efficient framework adaptation that keeps the quality of the results on a similar level. Furthermore, new fairness metrics are presented as well as detailed informations about necessary data preparations. Our evaluation of the framework implementations and metrics shows that our approach outperforms the state-of-the art for different types and degrees of bias present in training data in terms of both local and global fairness, while reaching comparable accuracy.Item Open Access Design and scaling of exoskeleton power units considering load cycles of humans(2022) Waldhof, Marcel; Wochner, Isabell; Stollenmaier, Katrin; Parspour, Nejila; Schmitt, SynExoskeletons are powerful tools for aiding humans with pathological conditions, in dangerous environments or in manually exhausting tasks. Typically, they are designed for specific maximum scenarios without taking into account the diversity of tasks and the individuality of the user. To address this discrepancy, a framework was developed for personalizing an exoskeleton by scaling the components, especially the electrical machine, based on different simulated human muscle forces. The main idea was to scale a numerical arm model based on body mass and height to predict different movements representing both manual labor and daily activities. The predicted torques necessary to produce these movements were then used to generate a load/performance cycle for the power unit design. Considering these torques, main operation points of this load cycle were defined and a reference power unit was scaled and optimized. Therefore, a scalability model for an electrical machine is introduced. This individual adaptation and scaling of the power unit for different users leads to a better performance and a lighter design.Item Open Access Stress-aware periodic test of interconnects(2022) Sadeghi-Kohan, Somayeh; Hellebrand, Sybille; Wunderlich, Hans-JoachimSafety-critical systems have to follow extremely high dependability requirements as specified in the standards for automotive, air, and space applications. The required high fault coverage at runtime is usually obtained by a combination of concurrent error detection or correction and periodic tests within rather short time intervals. The concurrent scheme ensures the integrity of computed results while the periodic test has to identify potential aging problems and to prevent any fault accumulation which may invalidate the concurrent error detection mechanism. Such periodic built-in self-test (BIST) schemes are already commercialized for memories and for random logic. The paper at hand extends this approach to interconnect structures. A BIST scheme is presented which targets interconnect defects before they will actually affect the system functionality at nominal speed. A BIST schedule is developed which significantly reduces aging caused by electromigration during the lifetime application of the periodic test.