The dependability of modern devices is enhanced by integrating an extensive number of extra-functional instruments. These are needed to facilitate cost-efficient bring-up, debug, test, diagnosis, and adaptivity in the field and might include, e.g., sensors, aging monitors, Logic, and Memory Built-In Self-Test (BIST) registers. Reconfigurable Scan Networks (RSNs) provide a flexible way to access such instruments as well the device's registers throughout the lifetime, starting from post-silicon validation (PSV) through manufacturing test and finally during in-field operation. At the same time, the dependability properties of the system can be affected through an improper RSN integration.
This doctoral project overcomes these problems and establishes a methodology to integrate dependable RSNs for a given system considering the most relevant dependability aspects, such as robustness, testability, and security compliance of RSNs.
