05 Fakultät Informatik, Elektrotechnik und Informationstechnik
Permanent URI for this collectionhttps://elib.uni-stuttgart.de/handle/11682/6
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Item Open Access Nontraditional design of dynamic logics using FDSOI for ultra-efficient computing(2023) Kumar, Shubham; Chatterjee, Swetaki; Dabhi, Chetan Kumar; Chauhan, Yogesh Singh; Amrouch, HussamItem Open Access Deep learning based soft sensors for industrial machinery(2020) Maschler, Benjamin; Ganssloser, Sören; Hablizel, Andreas; Weyrich, MichaelA multitude of high quality, high-resolution data is a cornerstone of the digital services associated with Industry 4.0. However, a great fraction of industrial machinery in use today features only a bare minimum of sensors and retrofitting new ones is expensive if possible at all. Instead, already existing sensors’ data streams could be utilized to virtually ‘measure’ new parameters. In this paper, a deep learning based virtual sensor for estimating a combustion parameter on a large gas engine using only the rotational speed as input is developed and evaluated. The evaluation focusses on the influence of data preprocessing compared to network type and structure regarding the estimation quality.Item Open Access Cryogenic embedded system to support quantum computing : from 5-nm FinFET to full processor(2023) Genssler, Paul R.; Klemme, Florian; Parihar, Shivendra Singh; Brandhofer, Sebastian; Pahwa, Girish; Polian, Ilia; Chauhan, Yogesh Singh; Amrouch, HussamItem Open Access User-friendly, requirement-based assistance for production workforce using an asset administration shell design(2020) Al Assadi, Anwar; Fries, Christian; Fechter, Manuel; Maschler, Benjamin; Ewert, Daniel; Schnauffer, Hans-Georg; Zürn, Michael; Reichenbach, MatthiasFuture production methods like cyber physical production systems (CPPS), flexibly linked assembly structures and the matrix production are characterized by highly flexible and reconfigurable cyber physical work cells. This leads to frequent job changes and shifting work environments. The resulting complexity within production increases the risk of process failures and therefore requires longer job qualification times for workers, challenging the overall efficiency of production. During operation, cyber physical work cells generate data, which are specific to the individual process and worker. Based on the asset administration shell for Industry 4.0, this paper develops an administration shell for the production workforce, which contains personal data (e.g. qualification level, language skills, machine access, preferred display and interaction settings). Using worker and process specific data as well as personal data, allows supporting, training and instating workers according to their individual capabilities. This matching of machine requirements and worker skills serves to optimize the allocation of workers to workstations regarding the ergonomic workplace setup and the machine efficiency. This paper concludes with a user-friendly, intuitive design approach for a personalized machine user interface. The presented use-cases are developed and tested at the ARENA2036 (Active Research Environment for the Next Generation of Automobiles) research campus.Item Open Access Cryogenic in-memory computing for quantum processors using commercial 5-nm FinFETs(2023) Parihar, Shivendra Singh; Thomann, Simon; Pahwa, Girish; Chauhan, Yogesh Singh; Amrouch, HussamItem Open Access Small delay fault testing with multiple voltages under variations : defect vs. fault coverage(2025) Jafarzadeh, Hanieh; Klemme, Florian; Amrouch, Hussam; Hellebrand, Sybille; Wunderlich, Hans-JoachimIt has been known and explored for many years that low voltage testing amplifies the effect of a defect, increasing the size of a Small Delay Fault (SDF) and, in the best case, turning SDFs into easily detectable stuck-at-faults. It is often overlooked that Vmintesting poses an additional challenge to the test pattern generation method under process variations. The standard deviation of gate delays under Vminis a multiple of that under nominal voltage. The increased variation will invalidate the efficiency of test patterns generated under nominal voltage and significantly reduce fault coverage. This paper presents the first algorithm for test pattern generation specifically tuned for Vmintesting which obtains higher fault coverage by smaller test sets than those generated for nominal voltage. The patterns applicable to other voltage levels can be derived from the pattern set generated under extreme variations at low supply voltage. Experimental results demonstrate that the proposed method produces test patterns that outperform N-detection test sets in terms of test set volume and fault efficiency across different voltage levels.