Universität Stuttgart

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    Dual wavelength heterodyne interferometry for rough surface measurements
    (1990) Fischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
    For interferometric topography measurements of optically rough surfaces dual wavelength heterodyne Interferometry (DWHI) is a powerful tool. A DWHI system based on a two-wavelength HeNe laser and a matched grating technique is described. This set-up improves system stability and simple heterodyne frequency generation.
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    ItemOpen Access
    Remote nondestructive material analysis by photothermal interferometry
    (1987) Sodnik, Zoran; Tiziani, Hans J.
    Interferometry is used for the detection of thermal waves to study material properties. A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. After mixing a phase shifted reference signal electrically to the interferometer signal, phase and amplitude exchange phenomena have been observed.
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    Nondestructive evaluation of solids by photothermal interferometry on nonreflective surfaces
    (1988) Sodnik, Zoran; Tiziani, Hans J.
    Thermal expansion interferometry is a simple and very sensitive tool for nondestructive material analysis. In its basic form highly reflective surfaces are needed however. We developed a modified experimental set-up that can be used on any surface and found a theoretical description in good agreement with the results.