(1980) Tiziani, Hans J.; Leonhardt, Klaus; Klenk, Jürgen
Storage of speckle pattern in real time by means of Bi12SiO20-crystals will be reported. Applying the double exposure technique, deformations, displacements as well as tilts can be analysed. The novel speckle technique displays the Young-interference fringes in quasi real time.
(1980) Tiziani, Hans J.; Klenk, Jürgen; Leonhardt, Klaus
Holographic interferometry and speckle application are powerful techniques for deformation, displacement and vibration analysis especially when they can be applied in real time. Bismuth Silicon Oxide crystals Bi12SiO20 (BSO) were used for real-time deformation, displacement and vibration analysis using holography and "speckle photography". After a short introduction of holographic interferometry for deformation measurement using BSO crystals, speckle applications for deformation, displacement and vibration analysis in real time will be discussed.
