Please use this identifier to cite or link to this item:
Authors: Tiziani, Hans J.
Title: Current state of optical testing
Issue Date: 1987 Konferenzbeitrag Creath, Katherine (Hrsg.): Surface characterization and testing. Bellingham, Wash. : SPIE, 1987 (Proceedings / SPIE 680). - ISBN 0-89252-715-3, S. 2-9
Abstract: Basic interferometry and holographic interferometry are becoming useful tools for precision measurements. The use of electronic solid state detector arrays, together with small computers for extracting the information from the interferograms improve their applications. Computer analysis is becoming increasingly important. A lot of information can be extracted from the interferograms leading to higher sensitivities and accuracies.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

Files in This Item:
File Description SizeFormat 
tiz48.pdf1,38 MBAdobe PDFView/Open

Items in OPUS are protected by copyright, with all rights reserved, unless otherwise indicated.