Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4321
Authors: Tiziani, Hans J.
Title: Current state of optical testing
Issue Date: 1987
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Creath, Katherine (Hrsg.): Surface characterization and testing. Bellingham, Wash. : SPIE, 1987 (Proceedings / SPIE 680). - ISBN 0-89252-715-3, S. 2-9
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60946
http://elib.uni-stuttgart.de/handle/11682/4338
http://dx.doi.org/10.18419/opus-4321
Abstract: Basic interferometry and holographic interferometry are becoming useful tools for precision measurements. The use of electronic solid state detector arrays, together with small computers for extracting the information from the interferograms improve their applications. Computer analysis is becoming increasingly important. A lot of information can be extracted from the interferograms leading to higher sensitivities and accuracies.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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