Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4330
Authors: Sodnik, Zoran
Tiziani, Hans J.
Title: Photothermal interferometry for nondestructive subsurface defect detection
Issue Date: 1986
metadata.ubs.publikation.typ: Zeitschriftenartikel
metadata.ubs.publikation.source: Optics communications 58 (1986), S. 295-299. URL http://dx.doi.org./10.1016/0030-4018(86)90229-4
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61004
http://elib.uni-stuttgart.de/handle/11682/4347
http://dx.doi.org/10.18419/opus-4330
Abstract: A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. Phase and amplitude exchange phenomena have been observed, when introducing an electronic reference phase shifter mixed to the interferometer signal. Experimental and theoretical results obtained with this system are presented.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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