Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4379
Authors: Tiziani, Hans J.
Title: Heterodyne interferometry using two wavelengths for dimensional measurements
Issue Date: 1992
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Pryputniewicz, Ryszard J. (Hrsg.): Laser interferometry IV : computer aided interferometry. 22-24 July 1991, San Diego, California. Bellingham, Wash. : SPIE, 1992 (Proceedings / SPIE 1553). - ISBN 0-8194-0681-3, S. 490-501
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61559
http://elib.uni-stuttgart.de/handle/11682/4396
http://dx.doi.org/10.18419/opus-4379
Abstract: Heterodyn interferometry is a powerful tool for high precision distance and vibration analysis. Two wavelength heterodyne techniques become very interesting for absolute distance measurement. It was shown, that a synthetic wavelength can be generated by two shorter ones. This leads also to the techniques to measure optically rougher surfaces because the optical path difference is to be compared with the synthetic wavelength. Further work will be reported.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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