Electric-field profiles in corona- or electron-beam-charged and thermally treated Teflon PTFE, FEP, and PFA films

Gerhard-Multhaupt, Reimund; Eberle, Gernot; Xia, Zhongfou; Yang, Guomao; Eisenmenger, Wolfgang

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DC Element	Wert	Sprache
dc.contributor.author	Gerhard-Multhaupt, Reimund	de
dc.contributor.author	Eberle, Gernot	de
dc.contributor.author	Xia, Zhongfou	de
dc.contributor.author	Yang, Guomao	de
dc.contributor.author	Eisenmenger, Wolfgang	de
dc.date.accessioned	2010-08-03	de
dc.date.accessioned	2016-03-31T08:36:07Z	-
dc.date.available	2010-08-03	de
dc.date.available	2016-03-31T08:36:07Z	-
dc.date.issued	1992	de
dc.identifier.other	353183768	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-56169	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4970	-
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4953	-
dc.description.abstract	Charge spreading in three different types of Teflon electrets was studied by means of piezoelectrically generated pressure steps, FEP and PFA samples corona-charged at room temperature usually exhibited only a surface charge layer. Uniform charge spreading throughout the bulk was found in FEP charged at or heated to high temperatures. Charge spreading was much less prominent in PFA because of a smaller retrapping efficiency. In PTFE (polytetrafluorethylene), charges from the surface and the rear electrode were injected into the bulk during charging at any temperature. Electron-beam-deposited charge layers broadened significantly upon heating.	en
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Elektret , Polymerfilm , Koronaentladung	de
dc.subject.ddc	530	de
dc.title	Electric-field profiles in corona- or electron-beam-charged and thermally treated Teflon PTFE, FEP, and PFA films	en
dc.type	conferenceObject	de
ubs.fakultaet	Fakultät Mathematik und Physik	de
ubs.fakultaet	Fakultätsübergreifend / Sonstige Einrichtung	de
ubs.institut	1. Physikalisches Institut	de
ubs.institut	Sonstige Einrichtung	de
ubs.opusid	5616	de
ubs.publikation.source	1992 annual report / Conference on Electrical Insulation and Dielectric Phenomena : October 18 - October 21, 1992. New York, NY : IEEE, 1992. - ISBN 0-7803-0565-5, S. 61-66	de
ubs.publikation.typ	Konferenzbeitrag	de
Enthalten in den Sammlungen:	08 Fakultät Mathematik und Physik

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