Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7935
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dc.contributor.authorWunderlich, Hans-Joachimde
dc.date.accessioned2012-04-27de
dc.date.accessioned2016-03-31T11:44:41Z-
dc.date.available2012-04-27de
dc.date.available2016-03-31T11:44:41Z-
dc.date.issued1989de
dc.identifier.other370125673de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73357de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/7952-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-7935-
dc.description.abstractA method is described for selecting a minimal set of directly accessible flip-flops. Since this problem turns out to be NP-complete, suboptimal solutions can be derived using some heuristics. An algorithm is presented to compute the corresponding weights of the patterns, which are time-dependent in some cases. The entire approach is validated with the help of examples. Only 10-40% of the flip-flops have to be integrated into a partial scan path or into a built-in self-test register to obtain nearly complete fault coverage by weighted random patterns.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationFlip-Flop , Selbsttest , Testbarkeitde
dc.subject.ddc621.3de
dc.titleThe design of random-testable sequential circuitsen
dc.typeconferenceObjectde
dc.date.updated2012-08-20de
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.opusid7335de
ubs.publikation.sourceDigest of papers / FTCS 19. Washington, DC : IEEE Computer Soc. Pr., 1989. - ISBN 0-8186-1959-7, S. 110-117. URL http://dx.doi.org./ 10.1109/FTCS.1989.105552de
ubs.publikation.typKonferenzbeitragde
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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