Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7939
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dc.contributor.authorWunderlich, Hans-Joachimde
dc.date.accessioned2012-04-27de
dc.date.accessioned2016-03-31T11:44:41Z-
dc.date.available2012-04-27de
dc.date.available2016-03-31T11:44:41Z-
dc.date.issued1988de
dc.identifier.other370123859de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73417de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/7956-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-7939-
dc.description.abstractAn efficient method has been presented to compute multiple distributions for random patterns, which can be applied successively. Using multiple distributions, all combinational circuits can be made random-testable, and complete fault coverage is provided by a few thousands of random patterns. The differently weighted random test sets can be applied to scan path circuits using an external chip, combining the advantages of a low cost test and of high fault coverage. Several facts about testing by random patterns have been proven. It has been shown that the number of random patterns required for a certain fault coverage can be computed without regarding the pseudorandom property and with the independence assumption for fault detection.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationFehlererkennung , Integrierte Schaltung , Testbarkeitde
dc.subject.ddc621.3de
dc.titleMultiple distributions for biased random test patternsen
dc.typeconferenceObjectde
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.opusid7341de
ubs.publikation.sourceNew frontiers in testing : proceedings. Washington, DC : IEEE Computer Soc. Pr., 1988. - ISBN 0-8186-0870-6, S. 236-244. URL http://dx.doi.org./10.1109/TEST.1988.207808de
ubs.publikation.typKonferenzbeitragde
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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