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Issue Date	Title	Author(s)
1992	Contouring by electronic speckle pattern interferometry with quadruple-beam illumination	Zou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1990	Dual wavelength heterodyne interferometry for rough surface measurements	Fischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
1993	Interferometry for high resolution absolute distance measuring by larger distances	Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1993	Resolution limits of active triangulation systems by defocusing	Seitz, Günther; Tiziani, Hans J.
1992	Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminations	Diao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
1994	Three-dimensional image sensing by chromatic confocal microscopy	Tiziani, Hans J.; Uhde, Hans-Martin
1994	Double pulse-electronic speckle interferometry	Pedrini, Giancarlo; Tiziani, Hans J.
1992	Heterodynverfahren für hochgenaue Vermessung im Nahbereich	Fischer, Edgar; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1993	High precision optical surface topometry	Tiziani, Hans J.
1992	A simplified multi-wavelength ESPI contouring technique based on a diode laser system	Peng, Xiang; Zou, Yunlu; Diao, Hongyan; Tiziani, Hans J.