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Results 11-20 of 23 (Search time: 0.004 seconds).
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Issue DateTitleAuthor(s)
1992Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminationsDiao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
1994A combined distance and surface profile measurement system for industrial applications : a european projectDocchio, Franco; Perini, Umberto; Tiziani, Hans J.
1994μ-Suboptimal design of a robustly performing controller for a chemical reactorAmann, Notker; Allgöwer, Frank
1991Phase shifting in an oblique incidence interferometerBoebel, Doris; Packroß, Bernd; Tiziani, Hans J.
1990Dual-wavelength interferometer for surface profileManhart, Sigmund; Maurer, R.; Tiziani, Hans J.; Sodnik, Zoran; Fischer, Edgar; Mariani, A.; Bonsignori, R.; Margheri, Giancarlo; Giunti, C.; Zatti, Stefano
1991Chemical process control : present status and future needs ; the view from European industrySchuler, Hans; Allgöwer, Frank; Gilles, Ernst Dieter
1994Dynamische Simulation verfahrenstechnischer Prozesse und Anlagen : ein Vergleich von WerkzeugenWatzdorf, Rüdiger von; Allgöwer, Frank; Helget, Andreas; Marquardt, Wolfgang; Gilles, Ernst Dieter
1992Optimierung des FahrverhaltensLangenbeck, Bernhard; Leister, Günter; Schiehlen, Werner; Kutzbach, Heinz-Dieter
1994Luftblaseneinfluss auf Schallgeschwindigkeit und Druckschwingungen in einem hydraulischen SystemHeisel, Uwe; Fiebig, Wieslaw; Mittwollen, Norbert; Oehler, Martin
1984Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensorLeonhardt, Klaus; Kaufmann, Ekkehart; Tiziani, Hans J.