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Issue Date	Title	Author(s)
1994	Double heterodyne interferometer using a multimode laser diode	Han, Sen; Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1990	Dual wavelength heterodyne interferometry for rough surface measurements	Fischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
1993	Interferometry for high resolution absolute distance measuring by larger distances	Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1992	Heterodynverfahren für hochgenaue Vermessung im Nahbereich	Fischer, Edgar; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1992	Doppelheterodyn-Interferometrie für hochgenaue Vermessung im Nahbereich	Fischer, Edgar; Dalhoff, Ernst; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1992	Dual wavelength heterodyne interferometry using a matched grating set-up	Fischer, Edgar; Ittner, Thomas; Dalhoff, Ernst; Sodnik, Zoran; Tiziani, Hans J.
1993	Double heterodyne interferometry for high precision distance measurements	Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1990	Dual-wavelength interferometer for surface profile	Manhart, Sigmund; Maurer, R.; Tiziani, Hans J.; Sodnik, Zoran; Fischer, Edgar; Mariani, A.; Bonsignori, R.; Margheri, Giancarlo; Giunti, C.; Zatti, Stefano
1993	Two wavelength heterodyne absolute ranging technique using suppressed carrier modulation	Fischer, Edgar; Dalhoff, Ernst; Ittner, Thomas; Kreuz, Silke; Tiziani, Hans J.
1991	Two-wavelength double heterodyne interferometry using a matched grating technique	Sodnik, Zoran; Fischer, Edgar; Ittner, Thomas; Tiziani, Hans J.