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Issue DateTitleAuthor(s)
1994Contouring by electronic speckle pattern interferometry employing divergent dual beam illuminationZou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1992Contouring by electronic speckle pattern interferometry with quadruple-beam illuminationZou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1992Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminationsDiao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
1992A simplified multi-wavelength ESPI contouring technique based on a diode laser systemPeng, Xiang; Zou, Yunlu; Diao, Hongyan; Tiziani, Hans J.
1993Design consideration of a dual-beam ESPI optical system for contouringDiao, Hongyan; Zou, Yunlu; Tiziani, Hans J.
1993A simplified multi-wavelength ESPI contouring technique based on a diode laser system. 2, Automatic fringe analysisPeng, Xiang; Zou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1992Contouring by modified dual-beam ESPI based on tilting illumination beamsPeng, Xiang; Diao, Hongyan; Zou, Yunlu; Tiziani, Hans J.
1992Geometry for contouring by electronic speckle pattern interferometry based on shifting illumination beamsZou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1994Derivatives obtained directly from displacement dataZou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1992A novel approach to determine decorrelation effect in a dual-beam electronic speckle pattern interferometerPeng, Xiang; Diao, Hongyan; Zou, Yunlu; Tiziani, Hans J.