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Results 1-10 of 33 (Search time: 0.001 seconds).
Item hits:
Issue DateTitleAuthor(s)
1994Contouring by electronic speckle pattern interferometry employing divergent dual beam illuminationZou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1994Three-dimensional analysis by a microlens-array confocal arrangementTiziani, Hans J.; Uhde, Hans-Martin
1993Atmospheric influence on image quality of airborne photographsLei, Fang; Tiziani, Hans J.
1990Contouring by electronic speckle pattern interferometry employing dual beam illuminationJoenathan, Charles; Pfister, Berthold P.; Tiziani, Hans J.
1992Contouring by electronic speckle pattern interferometry with quadruple-beam illuminationZou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1993Resolution limits of active triangulation systems by defocusingSeitz, Günther; Tiziani, Hans J.
1992Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminationsDiao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
1994Three-dimensional image sensing by chromatic confocal microscopyTiziani, Hans J.; Uhde, Hans-Martin
1992Heterodynverfahren für hochgenaue Vermessung im NahbereichFischer, Edgar; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1993High precision optical surface topometryTiziani, Hans J.

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