1. OPUS

Search


Current filters:


Start a new search
Add filters:

Use filters to refine the search results.

 | 
Results 1-10 of 48 (Search time: 0.001 seconds).
Item hits:
Issue DateTitleAuthor(s)
1985Verfahren zur optischen Rauheitsmessung und MikroprofilometrieLeonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.
1994Double heterodyne interferometer using a multimode laser diodeHan, Sen; Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
19890ptische Methoden der 3-D-Meßtechnik und BildverarbeitungTiziani, Hans J.
1989Mikro-Profilometrie zur Bestimmung der Topographie und Rauheit technischer Oberflächen mittels Heterodyn-LaserinterferometrieLeonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.
1992High precision laser supported close range distance measurementsTiziani, Hans J.
1990Dual wavelength heterodyne interferometry for rough surface measurementsFischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
1993Interferometry for high resolution absolute distance measuring by larger distancesDalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1983Holographic interferometry and speckle metrology : a review of the present stateTiziani, Hans J.
1983Applications of interferometry for testing macro/microgeometry of optical surfacesTiziani, Hans J.
1988Fringe analysis in holography with BSO applicationsTiziani, Hans J.

Discover