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dc.contributor.authorWagner, Stefan-
dc.date.accessioned2016-12-22T14:56:54Z-
dc.date.available2016-12-22T14:56:54Z-
dc.date.issued2006de
dc.identifier.isbn1-59593-263-1-
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-89798de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/8979-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-8962-
dc.description.abstractOne of the main cost factors in software development is the detection and removal of defects. However, the relationships and influencing factors of the costs and revenues of defect-detection techniques are still not well understood. This paper proposes an analytical, stochastic model of the economics of defect detection and removal to improve this understanding. The model is able to incorporate dynamic as well as static techniques in contrast to most other models of that kind. We especially analyse the model with state-ofthe-art sensitivity analysis methods to (1) identify the most relevant factors for model simplification and (2) prioritise the factors to guide further research and measurements.en
dc.language.isoende
dc.relation.uridoi:10.1145/1146238.1146247de
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.ddc004de
dc.titleA model and sensitivity analysis of the quality economics of defect-detection techniquesen
dc.typeconferenceObjectde
ubs.bemerkung.externCopyright ACM. This is the author’s version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in Proceedings of the 2006 International Symposium on Software Testing and Analysis, http://dx.doi.org/10.1145/1146238.1146247.de
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutFakultätsübergreifend / Sonstige Einrichtungde
ubs.konferenzname2006 International Symposium on Software Testing and Analysis (ISSTA'06)de
ubs.publikation.noppnyesde
ubs.publikation.sourceProceedings of the 2006 International Symposium on Software Testing and Analysis : ISSTA '06; Portland, Maine, USA - July 17-20, 2006. New York, NY : ACM, 2006. - ISBN 1-59593-263-1, S. 73-84de
ubs.publikation.typKonferenzbeitragde
Enthalten in den Sammlungen:15 Fakultätsübergreifend / Sonstige Einrichtung

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