Continuous high resolution phonon spectroscopy up to 12meV : measurement of the A+ binding energies in silicon

dc.contributor.authorBurger, Wilfriedde
dc.contributor.authorLassmann, Kurtde
dc.date.accessioned2009-10-12de
dc.date.accessioned2016-03-31T08:35:52Z
dc.date.available2009-10-12de
dc.date.available2016-03-31T08:35:52Z
dc.date.issued1986de
dc.description.abstractWe have measured the binding energies of Ga+, Al+, and In+ centers in silicon with energy-resolved phonon-induced electrical conductivity. For Ga+ and Al+ we obtain the value of about 2 meV as earlier found for B+, whereas the binding energy of In+ is 6 meV. Spectral structures attributed to impurity interactions found for higher concentrations of In at energies up to about 12 meV demonstrate that acoustic phonons up to this energy are transmitted from the tunnel junction to the substrate.en
dc.identifier.other317995383de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-47062de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/4918
dc.identifier.urihttp://dx.doi.org/10.18419/opus-4901
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationSilicium , Phononenspektroskopiede
dc.subject.ddc530de
dc.titleContinuous high resolution phonon spectroscopy up to 12meV : measurement of the A+ binding energies in siliconen
dc.typearticlede
ubs.fakultaetFakultät Mathematik und Physikde
ubs.institut1. Physikalisches Institutde
ubs.opusid4706de
ubs.publikation.sourcePhysical Review B 33 (1986), S. 5868-5870. URL http://dx.doi.org./10.1103/PhysRevB.33.5868de
ubs.publikation.typZeitschriftenartikelde

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