Frequency dependence of the specular and diffuse phonon scattering from silicon surfaces

dc.contributor.author	Burger, S.	de
dc.contributor.author	Lassmann, Kurt	de
dc.contributor.author	Eisenmenger, Wolfgang	de
dc.date.accessioned	2009-10-12	de
dc.date.accessioned	2016-03-31T08:35:52Z
dc.date.available	2009-10-12	de
dc.date.available	2016-03-31T08:35:52Z
dc.date.issued	1985	de
dc.date.updated	2010-02-03	de
dc.description.abstract	Phonon backscattering experiments with polished silicon surfaces show that there is no Kapitza anomaly at frequencies corresponding to the aluminum junction detector threshold (sim80 GHz), whereas at higher frequencies the anomalous transmission into liquid helium or solid nitrogen increases (reduced backscattering by the coverage), closely related to the increase of the diffuse scattering at the uncovered surface.	en
dc.identifier.other	317994530	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-47032	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4916
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4899
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Silicium , Phononenemission	de
dc.subject.ddc	530	de
dc.title	Frequency dependence of the specular and diffuse phonon scattering from silicon surfaces	en
dc.type	article	de
ubs.fakultaet	Fakultät Mathematik und Physik	de
ubs.institut	1. Physikalisches Institut	de
ubs.opusid	4703	de
ubs.publikation.source	Journal of low temperature physics 61 (1985), S. 401-412. URL http://dx.doi.org./10.1007/BF00683693	de
ubs.publikation.typ	Zeitschriftenartikel	de

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