Physical properties of speckles

dc.contributor.author	Tiziani, Hans J.	de
dc.date.accessioned	2011-02-22	de
dc.date.accessioned	2016-03-31T11:43:19Z
dc.date.available	2011-02-22	de
dc.date.available	2016-03-31T11:43:19Z
dc.date.issued	1978	de
dc.description.abstract	Speckles are no longer regarded merely as a noise element, but as a carrier of information to be used in different applications. This offers a powerful and simple tool for studying surface roughness, for measuring displacement and strain, and for deformation and vibration analysis.	en
dc.identifier.other	360701418	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60677	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/7511
dc.identifier.uri	http://dx.doi.org/10.18419/opus-7494
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Speckle-Interferometrie , Laser	de
dc.subject.ddc	530	de
dc.title	Physical properties of speckles	en
dc.type	bookPart	de
ubs.fakultaet	Fakultätsübergreifend / Sonstige Einrichtung	de
ubs.institut	Sonstige Einrichtung	de
ubs.opusid	6067	de
ubs.publikation.source	Erf, Robert K. (Hrsg.): Speckle metrology. New York : Acad. Pr., 1978. - ISBN 0-12-241360-1, S. 5-9	de
ubs.publikation.typ	Buchbeitrag	de

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