Wunderlich, Hans-JoachimHellebrand, Sybille2012-04-272016-03-312012-04-272016-03-311988370123263http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73421http://elib.uni-stuttgart.de/handle/11682/7957http://dx.doi.org/10.18419/opus-7940A method based on linear feedback shift registers over finite fields is presented to generate for a natural number n a pattern sequence with minimal length detecting each m-multiple stuck-open faults for M≤n. A hardware architecture is discussed generating this sequence, and for n=1 a built-in self-test (BIST) approach is presented that detects all combinations of multiple combinational and single stuck-open faults. The sequences are of minimum length, and can be produced either by software, by an external chip, or be a BIST-structure. Using the latter, the hardware overhead would be of the same magnitude as a conventional pseudorandom architecture.eninfo:eu-repo/semantics/openAccessMOS , Fehlererkennung , Selbsttest621.3conferenceObject2012-08-20