Tiziani, Hans J.Leonhardt, KlausKlenk, Jürgen2011-02-212016-03-312011-02-212016-03-311980346850924http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60703http://elib.uni-stuttgart.de/handle/11682/4321http://dx.doi.org/10.18419/opus-4304Storage of speckle pattern in real time by means of Bi12SiO20-crystals will be reported. Applying the double exposure technique, deformations, displacements as well as tilts can be analysed. The novel speckle technique displays the Young-interference fringes in quasi real time.eninfo:eu-repo/semantics/openAccessSpeckle-Interferometrie530article