Eschermann, BernhardWunderlich, Hans-Joachim2012-04-232016-03-312012-04-232016-03-311991369843738http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73143http://elib.uni-stuttgart.de/handle/11682/7937http://dx.doi.org/10.18419/opus-7920Most self-test techniques are implemented with so-called multifunctional test registers at any specific time either used for pattern generation or for response analysis. In a parallel self-test, however, test registers are used for pattern generation and response analysis simultaneously. In this paper a novel circuit structure for controllers with parallel self-test is presented, which does not result in a loss of fault coverage. By using a dedicated synthesis procedure, which considers the self-test hardware while generating the circuit structure instead of adding it after the design is completed ("synthesis for testability"), the self-test overhead can be kept low. The structure also facilitates realistic dynamic tests. As an example to illustrate the approach, the IEEE boundary scan controller is used.eninfo:eu-repo/semantics/openAccessSelbsttest , Prüfprogramm , Integrierte Schaltung621.3conferenceObject2012-08-10