Marx, DieterBuck, JochenLassmann, KurtEisenmenger, Wolfgang2009-10-072016-03-312009-10-072016-03-311978317914251http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46898http://elib.uni-stuttgart.de/handle/11682/4904http://dx.doi.org/10.18419/opus-4887In reflection experiments at free silicon [100]-surfaces we could distinguish between specularly and diffusely reflected transverse phonons propagated along <100>-directions. With increasing phonon frequency the number of diffusely scattered phonons increase relative to that of specularly reflected phonons.eninfo:eu-repo/semantics/openAccessPhonon , Silicium530article2014-09-11