Influence of defects on the splitting of the acceptor ground state in silicon

Ambrosy, AntonLassmann, KurtGoer, Anne M. deSalce, BernardZeile, Heinrich2009-10-122016-03-312009-10-122016-03-311984317970739http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-47024http://elib.uni-stuttgart.de/handle/11682/7071http://dx.doi.org/10.18419/opus-7054-eninfo:eu-repo/semantics/openAccessAkzeptor <Halbleiterphysik> , Silicium , Gitterbaufehler530Influence of defects on the splitting of the acceptor ground state in siliconconferenceObject2014-10-27