Mebert, JoachimMaile, BerndEisenmenger, Wolfgang2011-01-242016-03-312011-01-242016-03-311990353834580http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-59288http://elib.uni-stuttgart.de/handle/11682/5026http://dx.doi.org/10.18419/opus-5009We now report on phonon spectroscopy measurements in the frequency range from 300 GHz - 1 THz on thin amorphous films of several materials (i.e. e-beam evaporated SiO2., α-Si and α-Ge). Some films were prepared in a residual gas atmosphere as H20 and N2.eninfo:eu-repo/semantics/openAccessPhononenemission , Phononenspektroskopie530conferenceObject2011-11-29