Zou, YunluDiao, HongyanPeng, XiangTiziani, Hans J.2011-03-212016-03-312011-03-212016-03-311992349257809http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61699http://elib.uni-stuttgart.de/handle/11682/4380http://dx.doi.org/10.18419/opus-4363We present a new arrangement for contouring by electronic speckle pattern interferometry with four illumination beams, thereby making it unnecessary to move anything during the measurement.eninfo:eu-repo/semantics/openAccessSpeckle-Interferometrie , Interferometrie , Mustererkennung620Contouring by electronic speckle pattern interferometry with quadruple-beam illuminationarticle