Lassmann, KurtZeile, Heinrich2009-10-072016-03-312009-10-072016-03-31198031789773Xhttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46901http://elib.uni-stuttgart.de/handle/11682/4893http://dx.doi.org/10.18419/opus-4876In the following we will discuss ultrasonic measurements on p-type semiconductors reflecting spontaneous and defect sensitive modifications of the acceptor ground state.eninfo:eu-repo/semantics/openAccessUltraschallspektroskopie , Halbleiter , Akzeptor <Halbleiterphysik>530conferenceObject2014-10-27