Wunderlich, Hans-Joachim2012-04-272016-03-312012-04-272016-03-311988370123859http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73417http://elib.uni-stuttgart.de/handle/11682/7956http://dx.doi.org/10.18419/opus-7939An efficient method has been presented to compute multiple distributions for random patterns, which can be applied successively. Using multiple distributions, all combinational circuits can be made random-testable, and complete fault coverage is provided by a few thousands of random patterns. The differently weighted random test sets can be applied to scan path circuits using an external chip, combining the advantages of a low cost test and of high fault coverage. Several facts about testing by random patterns have been proven. It has been shown that the number of random patterns required for a certain fault coverage can be computed without regarding the pseudorandom property and with the independence assumption for fault detection.eninfo:eu-repo/semantics/openAccessFehlererkennung , Integrierte Schaltung , Testbarkeit621.3conferenceObject