Staiger, JoachimGroß, PeterLassmann, KurtBracht, HartmutStolwijk, Nicolaas A.2009-10-122016-03-312009-10-122016-03-311994318047063http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-47272http://elib.uni-stuttgart.de/handle/11682/7072http://dx.doi.org/10.18419/opus-7055We analyse by phonon spectroscopy low lying phonon scattering states from defects that are introduced by the diffusion of Zn into thick Si wafers.eninfo:eu-repo/semantics/openAccessPhononenspektroskopie , Phononenstreuung , Silicium , Gitterbaufehler530article2014-09-11