Wunderlich, Hans-JoachimStröle, Albrecht P.2012-04-182016-03-312012-04-182016-03-311991369510283http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73115http://elib.uni-stuttgart.de/handle/11682/7925http://dx.doi.org/10.18419/opus-7908Methods to minimize the number of evaluated signatures without reducing the fault coverage are presented. This is possible because the signatures can influence one another during the test execution. For a fixed test schedule a minimal subset of signatures can be selected, and for a predetermined minimal subset of signatures the test schedule can be constructed such that the fault coverage is maximum. Both approaches result in significant hardware savings when a self-test is implemented.eninfo:eu-repo/semantics/openAccessFehlererkennung , Selbsttest , Signaturanalyse621.3Maximizing the fault coverage in complex circuits by minimal number of signaturesconferenceObject