Wunderlich, Hans-Joachim2012-04-272016-03-312012-04-272016-03-311989370125673http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73357http://elib.uni-stuttgart.de/handle/11682/7952http://dx.doi.org/10.18419/opus-7935A method is described for selecting a minimal set of directly accessible flip-flops. Since this problem turns out to be NP-complete, suboptimal solutions can be derived using some heuristics. An algorithm is presented to compute the corresponding weights of the patterns, which are time-dependent in some cases. The entire approach is validated with the help of examples. Only 10-40% of the flip-flops have to be integrated into a partial scan path or into a built-in self-test register to obtain nearly complete fault coverage by weighted random patterns.eninfo:eu-repo/semantics/openAccessFlip-Flop , Selbsttest , Testbarkeit621.3conferenceObject2012-08-20