Stern, OlafWunderlich, Hans-Joachim2012-04-182016-03-312012-04-182016-03-311994369583035http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-72944http://elib.uni-stuttgart.de/handle/11682/7929http://dx.doi.org/10.18419/opus-7912For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavior. In this paper, a method is presented for computing the occurrence probabilities of certain defects and the realistic fault coverage for test sets. The method is highly efficient as a pre-processing step is used for partitioning the layout and extracting the defects ranked in the order of their occurrence probabilities. The method was applied to a public domain library where defects causing a complex faulty behavior are possible. The occurrence probability of these faults was computed, and the defect coverage for different test sets was determined.eninfo:eu-repo/semantics/openAccessCMOS , Fehlererkennung , Prüfprogramm621.3conferenceObject