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dc.contributor.authorKlein, Olivierde
dc.contributor.authorDonavan, Stevede
dc.contributor.authorDressel, Martinde
dc.contributor.authorGrüner, Georgede
dc.date.accessioned2009-08-31de
dc.date.accessioned2016-03-31T11:41:43Z-
dc.date.available2009-08-31de
dc.date.available2016-03-31T11:41:43Z-
dc.date.issued1993de
dc.identifier.other316498831de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46124de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/7040-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-7023-
dc.description.abstractThis report reviews the analysis used to extract the complex conductivity of a compound from a microwave cavity perturbation measurement. We intend to present a generalized treatment valid for any spheroidally shaped sample of arbitrary conductivity which is placed at either the electric or magnetic field antinode of the cavity. To begin with, we establish the relationship between the measured parameters and the conductivity for a spherical sample. Next, we extend these results to the case of spheroids; and for the first time, we cover all different configurations that one can possibly use to study an arbitrary conducting sample inside a cavity: in particular, all possible orientations of the sample with respect to the applied field are solved.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationElektrodynamik , Mikrowellenresonator , Oberflächenwiderstandde
dc.subject.ddc530de
dc.titleMicrowave cavity perturbation technique. Part 1, Principlesen
dc.typearticlede
dc.date.updated2010-03-08de
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.opusid4612de
ubs.publikation.sourceInternational Journal of Infrared and Millimeter Waves 14 (1993), S. 2423-2457. URL http://dx.doi.org./10.1007/BF02086216de
ubs.publikation.typZeitschriftenartikelde
Enthalten in den Sammlungen:15 Fakultätsübergreifend / Sonstige Einrichtung

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