Browsing by Author "Bracht, Hartmut"
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Item Open Access Phonon spectroscopy of defects correlated with the diffusion of Zn into Si(1994) Staiger, Joachim; Groß, Peter; Lassmann, Kurt; Bracht, Hartmut; Stolwijk, Nicolaas A.We analyse by phonon spectroscopy low lying phonon scattering states from defects that are introduced by the diffusion of Zn into thick Si wafers.