Browsing by Author "Runcevski, Tomce"

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    Application of in situ X-ray powder diffraction in solid state processes visualization
    (2014) Runcevski, Tomce; Dinnebier, Robert E. (Prof. Dr.)
    X-ray powder diffraction is as a powerful tool for structural analysis of crystalline compounds which do not grow as single crystals, but a polycrystalline bulk. When applied under non-ambient conditions, or when data are collected at consecutive time intervals, X-ray powder diffraction can be readily turned into a valuable method for in situ following, visualizing and ultimately explaining a number of solid state processes and chemical reaction. In the scope of my PhD work, an attempt to demonstrate the power and applicability of in situ X-ray powder diffraction in studying the reactivity of the solid state was made. In a period of almost 3 years, various systems were investigated when submitted under different external stimuli to initiate specific process and/or reaction in the solid state. The results described in this thesis were done working on six (independent) research projects, presented herein as separate case studies. (It should be noted that in parallel to the work performed on these six projects, research was done in several other topics, part of which is already published in scientific journals and the references are given in CV, attached at the end of the thesis).