Browsing by Author "Weissbrodt, Ernst"

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Open Access
Active electronic loads for radiometric calibration
(2017) Weissbrodt, Ernst; Kallfass, Ingmar (Prof. Dr.)
Although radiometer systems are widely applied in very different fields, they all have one important requirement in common: They require a thorough radiometric calibration. Various conventional calibration references are well established, but their bulkiness, high power consumption, and complexity are limiting the expanding fields of application. Since novel industrial applications such as passive millimeter-wave imaging emerge, the requirements for calibration references have increased drastically. But also in scientific fields like radio astronomy, cosmology or environmental monitoring, modern remote sensing radiometers do not rely only on conventional references anymore. In this work, millimeter-wave monolithic integrated circuits (MMICs) based on metamorphic high electron mobility transistors (mHEMT) were designed to be used as active electronic loads for radiometric calibration. These novel references have not only the outstanding property, that they can be directly integrated on chip-level into the radiometer front-end, but also, that they can exhibit cold as well as hot reference noise temperatures. Since this is achieved without any physical cooling or heating, the power consumption is notably reduced. By monolithic integration of field effect transistor (FET) switches, theses multiple references can internally be routed to the receiver input without any mechanical wear. As a result, laborious external references can be omitted and the repetition rate of the calibration procedure increased, which results in a higher radiometric accuracy and allows a more compact and cost-effective design of modern radiometer systems. This work presents the first radiometric calibration front-end that allows to internally switch between active electronic cold and active electronic hot loads, as well as a passive ambient load. All components are integrated on a single MMIC, and a patent was granted for this innovation. To predict the achievable noise temperatures of active cold loads (ACLs), different simulation approaches were previously published. This work evaluates and adapts these existing approaches to design and manufacture several W-band loads. But the required design-flow was found to be very time-consuming because multiple iterations are necessary to successively design and optimize the input- and output matching networks, and to finally achieve the desired low noise temperature. Therefore, a novel simulation approach is introduced that makes efficiently use of modern optimization algorithms and the very accurate model library of the mHEMT technology and the passive structures. With this novel simulation method, the first active hot loads (AHLs) were designed as well as state-of-the-art ACLs up to 140 GHz. However, the characterization of low-noise one-port devices is particularly challenging, especially at such high frequencies. Hence, a substantial part of this work is to investigate the reliability of different noise measurement setups and the repeatability of noise temperature results. Dedicated setups in W- and D-band are used to characterize all manufactured active loads and some selected results are cross-checked by measuring the same circuits with independently designed measurement systems of other research facilities. The discrepant results are discussed, concluding that high variations in measured one-port noise temperature do not allow to rely on one single measurement setup. At the same time, this thorough investigation and comparison permits to establish an accuracy range within which the results of the manufactured active electronic loads are reliable, whereas other previously published ACLs are typically only measured with one measurement setup.