Fault emulation for reconfigurable scan networks

Abstract

At around their standardization by the IEEE the interest on Reconfigurable Scan Networks (RSNs) by research and industry sparked. The testing of RSNs also raises new challenges. To analyze and cope with these challenges researchers are required to perform fault simulation. And the industry incorporated RSNs into their designs and need to test them to which also requires fault simulation. But the runtime of it is significantly high due to the RSNs’ structure. This thesis introduces a platform for fault emulation of RSNs and analyzes its feasibility. The speedup compared to fault simulation is presented and advantages, limitations and possible optimizations are evaluated and discussed.