Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-10483
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dc.contributor.advisorWunderlich, Hans-Joachim (Prof. Dr. rer. nat. habil.)-
dc.contributor.authorSchneider, Eric-
dc.date.accessioned2019-07-30T13:38:11Z-
dc.date.available2019-07-30T13:38:11Z-
dc.date.issued2019de
dc.identifier.other1670317331-
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/10500-
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-105005de
dc.identifier.urihttp://dx.doi.org/10.18419/opus-10483-
dc.description.abstractSimulation of circuits and faults is an essential part in design and test validation tasks of contemporary nano-electronic digital integrated CMOS circuits. Shrinking technology processes with smaller feature sizes and strict performance and reliability requirements demand not only detailed validation of the functional properties of a design, but also accurate validation of non-functional aspects including the timing behavior. However, due to the rising complexity of the circuit behavior and the steady growth of the designs with respect to the transistor count, timing-accurate simulation of current designs requires a lot of computational effort which can only be handled by proper abstraction and a high degree of parallelization. This work presents a simulation model for scalable and accurate timing simulation of digital circuits on data-parallel graphics processing unit (GPU) accelerators. By providing compact modeling and data-structures as well as through exploiting multiple dimensions of parallelism, the simulation model enables not only fast and timing-accurate simulation at logic level, but also massively-parallel simulation with switch level accuracy. The model facilitates extensions for fast and efficient fault simulation of small delay faults at logic level, as well as first-order parametric and parasitic faults at switch level. With the parallelization on GPUs, detailed and scalable simulation is enabled that is applicable even to multi-million gate designs. This way, comprehensive analyses of realistic timing-related faults in presence of process- and parameter variations are enabled for the first time. Additional simulation efficiency is achieved by merging the presented methods in a unified simulation model, that allows to combine the unique advantages of the different levels of abstraction in a mixed-abstraction multi-level simulation flow to reach even higher speedups. Experimental results show that the implemented parallel approach achieves unprecedented simulation throughput as well as high speedup compared to conventional timing simulators. The underlying model scales for multi-million gate designs and gives detailed insights into the timing behavior of digital CMOS circuits, thereby enabling large-scale applications to aid even highly complex design and test validation tasks.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.ddc004de
dc.titleMulti-level simulation of nano-electronic digital circuits on GPUsen
dc.typedoctoralThesisde
ubs.dateAccepted2019-06-21-
ubs.fakultaetInformatik, Elektrotechnik und Informationstechnikde
ubs.institutInstitut für Technische Informatikde
ubs.publikation.seitenxxii, 242de
ubs.publikation.typDissertationde
ubs.thesis.grantorInformatik, Elektrotechnik und Informationstechnikde
Appears in Collections:05 Fakultät Informatik, Elektrotechnik und Informationstechnik

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