Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4390
Authors: Dalhoff, Ernst
Fischer, Edgar
Kreuz, Silke
Tiziani, Hans J.
Title: Interferometry for high resolution absolute distance measuring by larger distances
Issue Date: 1993
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Waidelich, Wilhelm (Hrsg.): Laser in der Technik : Vorträge des 11. Internationalen Kongresses Laser 93. Berlin : Springer, 1994. - ISBN 3-540-57444-1, S. 248-251
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61808
http://elib.uni-stuttgart.de/handle/11682/4407
http://dx.doi.org/10.18419/opus-4390
Abstract: Among the incoherent techniques the phase measurement of modulated light seem to have reached some limitation with an resolution of less than 1 mm. This limitation is set by the bandwidth of the photodetector. The coherent techniques operate with two wavelengths to extend the unambiguity range of the classical interferometry. The unambiguity range is then half the synthetic wavelength and can be adjusted quite arbitrarily from some ten micrometers on. Among the incoherent techniques the phase measurement of modulated light seem to have reached some limitation with an resolution of less than 1 mm. This limitation is set by the bandwidth of the photodetector. The coherent techniques operate with two wavelengths to extend the unambiguity range of the classical interferometry. The unambiguity range is then half the synthetic wavelength and can be adjusted quite arbitrarily from some ten micrometers on.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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