Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4876
Authors: Lassmann, Kurt
Zeile, Heinrich
Title: Ultrasonic spectroscopy of the acceptor ground state in cubic semiconductors
Issue Date: 1980
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Maris, Humphrey J. (Hrsg.): Phonon scattering in condensed matter : proceedings of the third international conference. New York : Plenum Press, 1980. - ISBN 0-306-40355-2, S. 369-376
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46901
http://elib.uni-stuttgart.de/handle/11682/4893
http://dx.doi.org/10.18419/opus-4876
Abstract: In the following we will discuss ultrasonic measurements on p-type semiconductors reflecting spontaneous and defect sensitive modifications of the acceptor ground state.
Appears in Collections:08 Fakultät Mathematik und Physik

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