Please use this identifier to cite or link to this item:
Full metadata record
DC FieldValueLanguage
dc.contributor.authorKlein, Olivierde
dc.contributor.authorDonavan, Stevede
dc.contributor.authorDressel, Martinde
dc.contributor.authorGrüner, Georgede
dc.description.abstractThis report reviews the analysis used to extract the complex conductivity of a compound from a microwave cavity perturbation measurement. We intend to present a generalized treatment valid for any spheroidally shaped sample of arbitrary conductivity which is placed at either the electric or magnetic field antinode of the cavity. To begin with, we establish the relationship between the measured parameters and the conductivity for a spherical sample. Next, we extend these results to the case of spheroids; and for the first time, we cover all different configurations that one can possibly use to study an arbitrary conducting sample inside a cavity: in particular, all possible orientations of the sample with respect to the applied field are solved.en
dc.subject.classificationElektrodynamik , Mikrowellenresonator , Oberflächenwiderstandde
dc.titleMicrowave cavity perturbation technique. Part 1, Principlesen
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.publikation.sourceInternational Journal of Infrared and Millimeter Waves 14 (1993), S. 2423-2457. URL
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

Files in This Item:
File Description SizeFormat 
dre33.pdf1,21 MBAdobe PDFView/Open

Items in OPUS are protected by copyright, with all rights reserved, unless otherwise indicated.