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Authors: Staiger, Joachim
Groß, Peter
Lassmann, Kurt
Bracht, Hartmut
Stolwijk, Nicolaas A.
Title: Phonon spectroscopy of defects correlated with the diffusion of Zn into Si
Issue Date: 1994 Zeitschriftenartikel Materials science forum 143/147 (1994), S. 675-680. URL
Abstract: We analyse by phonon spectroscopy low lying phonon scattering states from defects that are introduced by the diffusion of Zn into thick Si wafers.
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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