Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7055
Authors: Staiger, Joachim
Groß, Peter
Lassmann, Kurt
Bracht, Hartmut
Stolwijk, Nicolaas A.
Title: Phonon spectroscopy of defects correlated with the diffusion of Zn into Si
Issue Date: 1994
metadata.ubs.publikation.typ: Zeitschriftenartikel
metadata.ubs.publikation.source: Materials science forum 143/147 (1994), S. 675-680. URL http://dx.doi.org./10.4028/www.scientific.net/MSF.143-147.675
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-47272
http://elib.uni-stuttgart.de/handle/11682/7072
http://dx.doi.org/10.18419/opus-7055
Abstract: We analyse by phonon spectroscopy low lying phonon scattering states from defects that are introduced by the diffusion of Zn into thick Si wafers.
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

Files in This Item:
File Description SizeFormat 
las49.pdf3,28 MBAdobe PDFView/Open


Items in OPUS are protected by copyright, with all rights reserved, unless otherwise indicated.