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http://dx.doi.org/10.18419/opus-7912
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DC Element | Wert | Sprache |
---|---|---|
dc.contributor.author | Stern, Olaf | de |
dc.contributor.author | Wunderlich, Hans-Joachim | de |
dc.date.accessioned | 2012-04-18 | de |
dc.date.accessioned | 2016-03-31T11:44:37Z | - |
dc.date.available | 2012-04-18 | de |
dc.date.available | 2016-03-31T11:44:37Z | - |
dc.date.issued | 1994 | de |
dc.identifier.other | 369583035 | de |
dc.identifier.uri | http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-72944 | de |
dc.identifier.uri | http://elib.uni-stuttgart.de/handle/11682/7929 | - |
dc.identifier.uri | http://dx.doi.org/10.18419/opus-7912 | - |
dc.description.abstract | For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavior. In this paper, a method is presented for computing the occurrence probabilities of certain defects and the realistic fault coverage for test sets. The method is highly efficient as a pre-processing step is used for partitioning the layout and extracting the defects ranked in the order of their occurrence probabilities. The method was applied to a public domain library where defects causing a complex faulty behavior are possible. The occurrence probability of these faults was computed, and the defect coverage for different test sets was determined. | en |
dc.language.iso | en | de |
dc.rights | info:eu-repo/semantics/openAccess | de |
dc.subject.classification | CMOS , Fehlererkennung , Prüfprogramm | de |
dc.subject.ddc | 621.3 | de |
dc.title | Simulation results of an efficient defect analysis procedure | en |
dc.type | conferenceObject | de |
ubs.fakultaet | Fakultätsübergreifend / Sonstige Einrichtung | de |
ubs.institut | Sonstige Einrichtung | de |
ubs.opusid | 7294 | de |
ubs.publikation.source | Proceedings / International Test Conference 1994. Piscataway, NJ : IEEE Service Center, 1994. - ISBN 0-7803-2102-2, S. 729-738. URL http://dx.doi.org./ 10.1109/TEST.1994.528019 | de |
ubs.publikation.typ | Konferenzbeitrag | de |
Enthalten in den Sammlungen: | 15 Fakultätsübergreifend / Sonstige Einrichtung |
Dateien zu dieser Ressource:
Datei | Beschreibung | Größe | Format | |
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wun6.pdf | 2,22 MB | Adobe PDF | Öffnen/Anzeigen |
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