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dc.contributor.authorWunderlich, Hans-Joachimde
dc.date.accessioned2012-04-23de
dc.date.accessioned2016-03-31T11:44:38Z-
dc.date.available2012-04-23de
dc.date.available2016-03-31T11:44:38Z-
dc.date.issued1990de
dc.identifier.other36972576Xde
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73234de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/7934-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-7917-
dc.description.abstractThe test of integrated circuits by random patterns is very attractive, since no expensive test pattern generation is necessary and tests can be applied with a self-test technique or externally using linear feedback shift registers. Unfortunately, not all circuits are random-testable, because either the fault coverage is too low or the required test length too large. In many cases the random test lengths can be reduced by orders of magnitude using weighted random patterns. However, there are also some circuits for which no single optimal set of weights exists. A set of weights defines a distribution of the random patterns. It is shown that the problem can be solved using several distributions instead of a single one, and an efficient procedure for computing the optimized input probabilities is presented. If a sufficient number of distributions is applied, then all combinational circuits can be tested randomly with moderate test lengths. The patterns can be produced by an external chip, and an optimized test schedule for circuits with a scan path can be obtained. Formulas are derived to determine strong bounds on the probability of detecting all faults.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationSelbsttest , Integrierte Schaltung , Fehlererkennungde
dc.subject.ddc621.3de
dc.titleMultiple distributions for biased random test patternsen
dc.typearticlede
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.opusid7323de
ubs.publikation.sourceIEEE transactions on computer-aided design 9 (1990), S. 584-593. URL http://dx.doi.org./10.1109/43.55187de
ubs.publikation.typZeitschriftenartikelde
Enthalten in den Sammlungen:15 Fakultätsübergreifend / Sonstige Einrichtung

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