Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7947
Authors: Schmid, Detlef
Camposano, Raúl
Kunzmann, Arno
Rosenstiel, Wolfgang
Wunderlich, Hans-Joachim
Title: The integration of test and high level synthesis in a general design environment
Issue Date: 1986
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Integrated circuit technology : proc. of the Integrated Circuit Technology Conference. Dublin : Boole Pr., 1986. - ISBN 0-906783-67-4, S. 317-331
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73530
http://elib.uni-stuttgart.de/handle/11682/7964
http://dx.doi.org/10.18419/opus-7947
Abstract: This paper describes the integration of new tools for both test and synthesis of integrated circuits. The presented design system CADDY (Carlsruhe Digital Design System) automatically transforms a functional description into a circuit structure. Besides this logic synthesis the system also automatically integrates a complete or incomplete scan path. The software tool PROTEST (PRObabilistic TESTability analysis tool) determines the random testability of the combinational parts of synthesized circuits and suggests optimized input signal probabilities to minimize the necessary test length. To generate these test patterns on chip a specific test hardware is proposed.
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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